A MEMS Electron Impact ion Source Integrated in a Micro-time-of-flight Mass Spectrometer

MEMS ion source for mass spectrometer integrated on a chip

Design, Construction and Calibration of a Laser Ionization Time-of-Flight Mass Spectrometer

A time-of-flight mass spectrometer (TOF-MS) developed in our laboratory at Isfahan University of Technology is described here. The TOF-MS instrument uses laser as the ionization source which provides an opportunity to investigate the ions formed in laser ablation or desorption. The TOF-MS has an ionization chamber containing an accelerator and an ion lens to focus the ions into a one meter line...

Electron-time Of-flight Spectrometer

A velocity selector is described which is designed for measurement of the total collision cross section of electrons in the energy region below one volt. The system determines the distributions of times of flight of single electrons over a measured path at selected pressures of a specimen gas. The electrons are generated by repetitive illumination of a photo-emitter by a spark gap, pass over a ...

An ion trap storage/time-of-flight mass spectrometer

An ion trap/time-of-flight (TOF) mass spectrometer combination has been developed in order to combine the storage capabilities of an ion trap with the speed and resolution of a time-of-flight device. The ion trap is an rf quadrupole trap which operates in the total storage mode, i.e., with the dc voltage=0 on the end caps and rf voltage on the ring electrode. The trap has an ion storage time of...

C60 secondary ion mass spectrometry with a hybrid-quadrupole orthogonal time-of-flight mass spectrometer.

A hybrid quadrupole orthogonal time-of-flight mass spectrometer optimized for matrix-assisted laser desorption ionization (MALDI) and electrospray ionization has been equipped with a C 60 cluster ion source. This configuration is shown to exhibit a number of characteristics that improve the performance of traditional time-of-flight secondary ion mass spectrometry (TOF-SIMS) experiments for the ...